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Idesaki, Akira; Morishita, Norio; Ito, Hisayoshi; Kamiya, Tomihiro; Nakamoto, Tatsushi*; Kimura, Nobuhiro*; Makida, Yasuhiro*; Ogitsu, Toru*; Ohata, Hirokatsu*; Yamamoto, Akira*
AIP Conference Proceedings 824, p.330 - 334, 2006/03
Polyimide films and glass fiber reinforced plastics (GFRPs) are used as insulating or structural materials for superconducting magnets in a neutrino beam line of the Japan Proton Accelerator Research Complex (J-PARC). It is indispensable to evaluate radiation resistance of these materials, because they are required to keep their electrical and mechanical properties in a high radiation field of 30 kGy/year at low temperature of 4 K. In this work, the gas evolution resulting from chemical reactions induced in the polyimide films and GFRPs by ray irradiation at 77 K was investigated. It was found that the main component of the evolved gas is hydrogen. The amount of hydrogen evolved from the superconducting magnet system used in the neutrino beam line was estimated to be 0.37 mol/year (0.01 L/year as the volume of liquid hydrogen). It indicates that the hydrogen evolved from the organic materials does not influence on the operation of the helium purifying system.
Suzuki, Yasuyuki; Maekawa, Yasunari; Yoshida, Masaru; Maeyama, Katsuya*; Yonezawa, Noriyuki*
Chemistry of Materials, 14(10), p.4186 - 4191, 2002/10
Times Cited Count:17 Percentile:53.64(Chemistry, Physical)Dual tone imaging of polyimide films was prepared by Xe ion beam irradiation of partially imidized polyamic acid (PAA) films followed by alkaline etching in aqueous tetramethylammonium hydroxide solution and heating of treated films. In 87% imidized PAA film, ion beam irradiation produced a negative hemispheric structured image with 1.0 mm height and 1.5 mm diameter. In contrast, a positive hole pattern with 0.3 mm diameter appeared on the 82% imidized PAA film. Positive and negative images were considered to be switched by slight change in the balance of scission and crosslinking of the polymer chains, resulting from energy deposition of the ion beam.
Iwai, Yasunori; Yamanishi, Toshihiko; Nishi, Masataka
Journal of Nuclear Science and Technology, 36(1), p.95 - 104, 1999/01
Times Cited Count:12 Percentile:66.16(Nuclear Science & Technology)no abstracts in English
*; Inagaki, Yoshiyuki; ; Sekita, Kenji; Haga, Katsuhiro; Hino, Ryutaro
JAERI-Research 97-076, 33 Pages, 1997/10
no abstracts in English
Seguchi, Tadao
Hoshasen To Sangyo, 0(66), p.4 - 8, 1995/00
no abstracts in English
Komaki, Yoshihide; ; Sakurai, Tsutomu; Matsumoto, Yasuyo*
Radiat. Meas., 23(4), p.725 - 729, 1994/00
Times Cited Count:0 Percentile:0.01(Nuclear Science & Technology)no abstracts in English
*; Shibanuma, Kiyoshi; Okawa, Yoshinao; Seguchi, Tadao
JAERI-M 93-067, 43 Pages, 1993/03
no abstracts in English
*; Hama, Yoshimasa*; Sasuga, Tsuneo; Seguchi, Tadao
Polymer, 32(14), p.2499 - 2504, 1991/00
Times Cited Count:19 Percentile:67.41(Polymer Science)no abstracts in English
*; Konishi, Hiroyuki; Nagasaki, Takanori
JAERI-M 90-137, 11 Pages, 1990/08
no abstracts in English
JAERI-M 90-054, 57 Pages, 1990/03
no abstracts in English
Komaki, Yoshihide; Matsumoto, Yasuyo*; ; Sakurai, Tsutomu
Polym. Commun., 30, p.43 - 44, 1989/02
no abstracts in English
Sasuga, Tsuneo
Polymer, 29, p.1562 - 1568, 1988/00
Times Cited Count:11 Percentile:55.99(Polymer Science)no abstracts in English
Sasuga, Tsuneo; Hagiwara, Miyuki
Kobunshi Rombunshu, 42(4), p.283 - 290, 1985/04
Times Cited Count:2 Percentile:22.32(Polymer Science)no abstracts in English
; M.A.Kirk*; R.C.Birtcher*; Hagiwara, Miyuki; Kawanishi, Shuichi
Nuclear Instruments and Methods in Physics Research B, B1, p.610 - 616, 1984/00
no abstracts in English
; M.A.Kirk*; R.C.Birtcher*; Hagiwara, Miyuki; Kawanishi, Shuichi
Journal of Nuclear Materials, 119(2-3), p.146 - 153, 1983/00
Times Cited Count:15 Percentile:81.67(Materials Science, Multidisciplinary)no abstracts in English
Koshikawa, Hiroshi; Asano, Masaharu*; Yamaki, Tetsuya; Maekawa, Yasunari
no journal, ,
We investigated track etch rates (V) of polyimide irradiated with different ions by a conductivity technique and their LET dependence. Both of 12 and 25 m thick films were irradiated with 450 MeV Xe, 250 MeV Ar and 75 MeV Ne and then were etched with a sodium hypochlorite solution. The conductometric analysis involves recording electric conductance of the etchant across the film during the etching time. When the etched pores from both sides of the film made contact with each other, the conductance suddenly increased to find the breakthrough time (T). A V value was obtained by dividing the half thickness of the films by T. The Xe ions with the highest LET of 12 MeV/m gave ca. 20 times higher V than the Ne ions. The change in V for the different beams is ascribed to an LET effect by considering that the bombardment with high-LET ions produces more severe molecular damage in each track.